Ellipsometer or reflectometer: choosing a film thickness tool
Reflectometers measure routine films quickly and cheaply. Ellipsometers handle very thin films, unknown materials and stacks. How to choose for your lab.
How the processes behind the tools work, from DRIE and ALD to LPCVD and lift-off, and which type of tool fits which job in a research cleanroom.
Reflectometers measure routine films quickly and cheaply. Ellipsometers handle very thin films, unknown materials and stacks. How to choose for your lab.
How the Bosch process alternates etch and passivation to cut deep, vertical features in silicon, what limits it, and what to check on a used DRIE tool.
Thermal ALD gives the best conformality and the simplest tool. Plasma ALD adds lower temperatures and more materials. How to choose for a shared research lab.
Temperature, stress, hydrogen content and etch resistance separate PECVD and LPCVD nitride. How to choose the process, and the tool, for your device.
Why lift-off favours a directional e-beam evaporator, when sputtering still works, and what to check on a used tool before you rely on it for metal patterns.