Ellipsometer or reflectometer: choosing a film thickness tool
Reflectometers measure routine films quickly and cheaply. Ellipsometers handle very thin films, unknown materials and stacks. How to choose for your lab.
50 mm (2 in), 75 mm (3 in), 100 mm (4 in), 150 mm (6 in), 200 mm (8 in) · 1990s–2010s
The ResMap 178 maps sheet resistance across 50–200 mm wafers in a bench-top unit. We inspect, service and calibrate used systems for implant, diffusion and metal film control.
Price on request
The CDE ResMap 178 is a bench-top four-point probe that maps sheet resistance across a whole wafer. In a research cleanroom or small fab it sits downstream of the implanter, the diffusion furnace and the metal deposition tools. It answers whether the implant dose landed, whether the diffusion is uniform from wafer centre to edge, and whether a sputtered or evaporated metal film has the expected thickness and resistivity.
The 178 is a manually loaded model. You place the wafer, choose a recipe and the tool steps the probe through the map. Used ResMap 178 units are attractive for labs that need full-wafer maps without the footprint of an automated cassette system. Because it measures electrically rather than optically, it complements thickness tools such as a reflectometer.
The probe head is where most problems start, so we look at it first.
A typical refurbishment replaces or reconditions the probe head, cleans and adjusts the stage drive, checks and replaces cables and connectors in the measurement path, and recalibrates the electronics. We rebuild the recipe set for your wafer sizes and film types, and then run reference maps for the report. Probe heads are consumables: tip life depends on force, film hardness and how many sites you measure, so we include a view on spare heads in our quote.
The ResMap is a simple tool, and most upgrades are about matching it to your films and keeping data accessible. Labs that measure both implants and thin metals often run two heads and swap them by film type. Older PCs and data formats are the main risk, and we move the software to supported hardware where the licence and interface allow. Probe heads, chucks, cables and reference standards are available through spare parts, and periodic checks against standards are part of our calibration service.
List your film types and their sheet resistance range before choosing heads. A head that works well on implanted silicon may damage a 20 nm metal film, and the opposite combination gives unstable contact. Ask which heads come with the tool, their condition and when they were last calibrated. If you need cassette loading for production volumes, a manual 178 is not the right model. For cassette-fed mapping or optical film measurement, see the other tools in our metrology and inspection range.
Typical values for the platform. Each tool’s inspection report lists its actual configuration.
Rebuild used tools to their original specification, with a written scope and a test report.
Learn moreKeep older process tools running with planned maintenance, repair, calibration and parts.
Learn moreMoving a process tool from one cleanroom to another, and getting it running at the new site.
Learn moreNeed a spare part for the ResMap 178? Send us the part number and we will check what we can supply.
It depends on the film. Harder, sharper tips suit implanted and diffused silicon, while blunter tips with lower force suit thin metal films that a sharp tip would punch through. We match the head to your film list before delivery.
Four-point probe needs an electrically active layer, so implants are measured after the activation anneal. Very shallow or lightly doped layers may need a suitable head and current range.
We check the current source and voltmeter, then measure reference standards across the range you use. The deviations are recorded in the inspection report.
Many units accept square samples within the chuck area in addition to round wafers. We confirm the chuck and holders supplied with the specific tool.
300 mm (12 in) with mapping stage · 2000s–2020s
200 mm (8 in) · 1990s–2000s
Reflectometers measure routine films quickly and cheaply. Ellipsometers handle very thin films, unknown materials and stacks. How to choose for your lab.
Tell us the process, wafer size and facilities. We reply with availability, an inspection report and a refurbishment scope.