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Hitachi

Hitachi S-4800 field-emission SEM

Pieces, 100 mm (4 in), 150 mm (6 in) · 2000s–2010s

The S-4800 is a cold field-emission SEM for high-resolution imaging of devices, nanostructures and cross-sections. We inspect, relocate and service used units for research labs.

Price on request

Where the S-4800 fits

The Hitachi S-4800 is a cold field-emission scanning electron microscope that became one of the standard high-resolution SEMs in university characterisation centres and semiconductor labs. It followed the S-4700 and uses Hitachi's semi-in-lens objective with upper and lower detectors and ExB signal filtering. In practice that means sharp images of nanostructures, gate cross-sections and resist profiles at low voltages, where charging and beam damage are less of a problem.

A used S-4800 SEM is a common route to high-resolution imaging for labs that cannot justify a new FE-SEM. It is a demanding instrument to move and install, though. Most of the risk lies in the gun vacuum and the site, not the electronics, which is where our inspection and relocation planning focus.

What we inspect on a used S-4800

  • Gun and emission. Ion pump currents for the gun and intermediate chambers, emission stability after flashing, and the flash history where the software records it.
  • Column alignment and resolution. We image a resolution standard at high and low voltage and record the results.
  • Vacuum system. Turbo pump, rotary or dry backing pump, valve operation, airlock cycle times and chamber base pressure.
  • Stage. Travel on all axes, tilt and rotation, and the airlock transfer rod and holders.
  • Detectors. Upper and lower SE detector signal, scintillator condition and any BSE or EDX detectors fitted.
  • Electronics and PC. High voltage stability, the control PC and operating system, and the image archive.
  • Cooling. Water chiller or cooling circuit flow and temperature.

Refurbishment and service scope

A typical refurbishment covers backing pump service or replacement, turbo pump checks, cleaning of the chamber and airlock, replacement of apertures, O-ring changes on chamber doors and ports, and detector scintillator replacement where the signal is weak. Gun work depends on the inspection: a stable tip is left alone; a failing tip or a gun that has been vented is quoted separately because it involves a bake and realignment. The result is graded Certified, Refurbished, Inspected or As-is, and Certified units include resolution images in the report.

Upgrades and spare parts

EDX is the most requested addition, either a new silicon drift detector or a replacement for an older liquid-nitrogen-cooled detector. A chamber plasma cleaner reduces hydrocarbon contamination at high magnification. We also recommend a UPS for the ion pumps so a short power cut does not vent the gun. Apertures, scintillators, vacuum gauges, O-rings and pump parts are the regular spares, sourced through our spare parts service.

Facilities

  • Dedicated single-phase power, with a UPS for the ion pumps
  • Cooling water or a recirculating chiller
  • Dry nitrogen for venting the chamber and airlock
  • Exhaust for the backing pump, depending on pump type
  • Low vibration floor and low AC magnetic field, measured before installation
  • Stable room temperature without direct airflow on the column

Buying advice

Have the room surveyed before you commit. An S-4800 in a room with high vibration or magnetic fields will not reach its resolution, whatever its condition. Ask how the tool was shut down and stored, and whether the gun stayed under vacuum; a gun that has been vented adds cost and time. Plan the move as one project with rigging and transport and commissioning and acceptance, so the bake, alignment and resolution test follow directly after delivery. If a SEM is more than your samples need, the metrology section also covers profilers and film measurement tools.

Specifications

Typical configuration

Wafer sizes
Pieces, 100 mm (4 in), 150 mm (6 in)
Electron source
Cold field-emission gun
Resolution
Typically 1.0 nm at 15 kV; about 2.0 nm at 1 kV, or 1.4 nm with beam deceleration where fitted
Accelerating voltage
Typically 0.5–30 kV
Detectors
Upper and lower secondary electron detectors with ExB signal filtering; BSE and EDX depending on configuration
Specimen size
Up to 100 mm or 150 mm diameter depending on stage type
Specimen exchange
Airlock exchange chamber

Typical values for the platform. Each tool’s inspection report lists its actual configuration.

Services

What we do for the S-4800

Refurbishment

Rebuild used tools to their original specification, with a written scope and a test report.

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Maintenance

Keep older process tools running with planned maintenance, repair, calibration and parts.

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Installation

Moving a process tool from one cleanroom to another, and getting it running at the new site.

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Upgrades

Common upgrades

About upgrades
  • EDX detector and analysis system, new or replacing an older Si(Li) unit
  • Plasma cleaner on the specimen chamber to reduce contamination
  • Replacement PC and image export, where the control software allows
  • Uninterruptible power supply for the ion pumps

Need a spare part for the S-4800? Send us the part number and we will check what we can supply.

FAQ

Questions and answers

How long does a cold field-emission tip last?

Tip life depends on gun vacuum, flashing routine and how the tool is shut down. A stable gun vacuum is the best predictor, so we log ion pump readings and emission behaviour at inspection.

Can a used S-4800 be moved without losing the gun vacuum?

The gun and column ion pumps should stay powered as long as possible, and a move usually means a controlled vent and a bake-out on site afterwards. We plan the move, the bake and the re-alignment together.

What site conditions does an S-4800 need?

Low floor vibration, low stray AC magnetic fields, stable room temperature and a dedicated power supply. We measure vibration and field at the planned location before the tool ships.

Do you sell EDX systems with the SEM?

We can include an EDX detector from the tool's existing configuration or quote a separate detector. The analysis software is licensed by the EDX manufacturer, so licence transfer is checked before sale.

Metrology & inspection

More tools in this category

All metrology & inspection
Guides

Related reading

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Next step

Interested in the Hitachi S-4800?

Tell us the process, wafer size and facilities. We reply with availability, an inspection report and a refurbishment scope.