Ellipsometer or reflectometer: choosing a film thickness tool
Reflectometers measure routine films quickly and cheaply. Ellipsometers handle very thin films, unknown materials and stacks. How to choose for your lab.
Pieces, 100 mm (4 in), 150 mm (6 in), 200 mm (8 in) · 1990s–2020s
Tencor P-series profilers measure step heights, roughness and wafer bow in many research cleanrooms. We inspect and refurbish used P-6 to P-17 class tools for 150 and 200 mm work.
Price on request
The Tencor P-series is the bench-top stylus profiler line that started at Tencor Instruments in the late 1980s and continued under KLA-Tencor and KLA. Used P-series profilers are common because so many were installed across research, MEMS and compound semiconductor labs. They answer the everyday questions of a cleanroom: how deep did the etch go, how thick is the resist or metal step, how rough is the surface, and how much has the wafer bowed after deposition.
Different generations are on the market. Older P-10, P-11 and P-15 class tools are still running in many labs; the P-16 and P-16+ added a newer sensor and software; the P-6 is the compact 150 mm model, and the P-7 and P-17 are the current bench-top versions. Sample size, scan length and vertical range differ by model, so we confirm them against the nameplate and installed options, not just the model badge.
A typical refurbishment replaces the stylus, cleans and adjusts the scan stage, replaces worn cables and fans, and recalibrates step height and force against standards. Where the PC is near end of life, we image the drive first and move to new hardware if the software and interface cards allow. Sensor faults are the expensive repair on this platform: we diagnose them before quoting and tell you whether the head can be repaired or needs replacing from stock. Faults during use are handled through repair and troubleshooting.
The upgrades that add the most to a research profiler are software options: stress measurement, 3D mapping and pattern recognition for repeated sites. On older units, a new isolation table often improves results more than any software change. Styli, step height standards, stage parts, lamps and PCs are the usual spares; ageing electronics are the main long-term risk, which our post on keeping legacy tools running covers in more detail.
Start with the largest sample you need to measure and whether you need wafer bow or stress. A 150 mm compact model is enough for most piece and 100 mm work; 200 mm stress mapping needs a larger stage and the stress option. Ask which options are licensed, not just installed, and which software version runs. A recent calibration on traceable standards tells you more about a used profiler than its age. If you also need film thickness or optical constants, compare profilers with the optical tools in our metrology range.
Typical values for the platform. Each tool’s inspection report lists its actual configuration.
Rebuild used tools to their original specification, with a written scope and a test report.
Learn moreRetrofit older tools with new controls, light sources, pumps, wafer sizes or endpoint detection.
Learn moreKeep older process tools running with planned maintenance, repair, calibration and parts.
Learn moreMoving a process tool from one cleanroom to another, and getting it running at the new site.
Learn moreNeed a spare part for the P-series? Send us the part number and we will check what we can supply.
We work on the bench-top P-series family, including the P-6, P-7, P-10 to P-16+ and P-17 classes. Each inspection report names the exact model, sensor head and software version.
Yes, when the stress option is installed. The tool measures wafer bow before and after deposition and calculates stress with Stoney's equation; you need the substrate thickness and elastic constants.
It depends on force, scan length and the samples measured. A chipped or contaminated tip shows up as noisy or rounded steps on a calibration standard, which is what we check at inspection and during maintenance.
We calibrate against reference step height standards and record the results in the report. If you need your own standard for routine checks, we can advise on heights that match your process.
300 mm (12 in) with mapping stage · 2000s–2020s
200 mm (8 in) · 1990s–2000s
Reflectometers measure routine films quickly and cheaply. Ellipsometers handle very thin films, unknown materials and stacks. How to choose for your lab.
Tell us the process, wafer size and facilities. We reply with availability, an inspection report and a refurbishment scope.